KSEMAW: an open source software for the analysis ofspectrophotometric, ellipsometric andphotothermal deflection spectroscopy measurements [version 1; peer review: 2 approved]
The optical behavior of devices based on thin films is determined by complex refractive index and thickness of each slab composing the stack; these important parameters are usually evaluated from photometric and/or ellipsometric spectral measurements, given a model of the stack, by means of dedicated software.In the case of complex multilayer devic